X-ray topography by using resonant scattering
نویسندگان
چکیده
منابع مشابه
Resonant elastic soft x-ray scattering.
Resonant (elastic) soft x-ray scattering (RSXS) offers a unique element, site and valence specific probe to study spatial modulations of charge, spin and orbital degrees of freedom in solids on the nanoscopic length scale. It is not only used to investigate single-crystalline materials. This method also enables one to examine electronic ordering phenomena in thin films and to zoom into electron...
متن کاملElectronic structure of Ni complexes by X-ray resonance Raman spectroscopy (resonant inelastic X-ray scattering).
The potential of 1s2p resonant inelastic (Raman) X-ray scattering (RIXS) is demonstrated for a series of Ni coordination complexes. In this technique, incident and scattered photon energies lie in the hard X-ray range (>5 keV). The 1s2p RIXS contour plots provide information that is complementary to K-edge and L-edge spectroscopy. RIXS spectroscopy promises to be a valuable probe of electronic ...
متن کاملA Resonant X-ray Scattering Study of Octahedral Tilt Ordering Typeset Using Revt E X 2
We report an x-ray scattering study of octahedral tilt ordering in the man-ganite series Pr 1−x Ca x MnO 3 with x=0.4 and 0.25 and in LaMnO 3. The sensitivity to tilt ordering is achieved by tuning the incident x-ray energy to the L I , L II and L III absorption edges of Pr and La, respectively. The resulting energy-dependent profiles are characterized by a dipole-resonant peak and higher energ...
متن کامل1s2p resonant inelastic X-ray scattering of iron oxides.
1s2p resonant inelastic X-ray scattering (RIXS) spectroscopy has been measured for a series of iron oxides, including octahedral and tetrahedral Fe(II) and Fe(III) systems. Their spectral shapes have been analyzed and explained using crystal-field multiplet simulations. The RIXS planes and the K-edge and L-edge X-ray absorption spectra related to these RIXS planes will be discussed with respect...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2005
ISSN: 0108-7673
DOI: 10.1107/s0108767305081195